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Wafer-scale silver nanoislands with ∼5 nm interstitial gaps for surface-enhanced Raman scattering
- Source :
- Optical Materials Express. 10:3359
- Publication Year :
- 2020
- Publisher :
- Optica Publishing Group, 2020.
-
Abstract
- Nanogap-rich silver nanoislands with fascinating optical properties are desirable substrates for surface-enhanced Raman scattering (SERS). Here, we propose a simple and high-throughput approach through the laser molecular beam epitaxy (LMBE) technique for preparing silver nanoislands containing large numbers of intra-nanogaps on a silicon wafer (6×6 cm2). By optimizing the deposition time, the enlarged silver nanoislands with ∼5 nm interstitial gaps of abundance and homogeneity were formed. Remarkably, the optimized SERS substrate with high-density hotspots demonstrated a high analytical enhancement factor (AEF) as large as 1.17×105, excellent reproducibility with relative standard deviation (RSD) of 7.76% over the entire substrate, and good stability after storage for 21 days. The electromagnetic field distribution of the optimized SERS substrate was simulated using the software COMSOL Multiphysics based on the actual SEM image of the fabricated sample, and the calculated enhancement factor (EF) is as high as 109. Furthermore, it can enable sensitive and quantitative detection of malachite green at concentrations as low as 10−8 M. This simple fabrication of silver nanoislands with homogeneous ∼5 nm interstitial gaps provides a practical solution for wafer-scale, sensitive, and reproducible SERS substrates.
- Subjects :
- Materials science
Fabrication
business.industry
02 engineering and technology
021001 nanoscience & nanotechnology
Laser
01 natural sciences
Electronic, Optical and Magnetic Materials
law.invention
010309 optics
symbols.namesake
law
Physical vapor deposition
0103 physical sciences
symbols
Optoelectronics
Wafer
Surface plasmon resonance
0210 nano-technology
business
Raman scattering
Electron-beam lithography
Molecular beam epitaxy
Subjects
Details
- ISSN :
- 21593930
- Volume :
- 10
- Database :
- OpenAIRE
- Journal :
- Optical Materials Express
- Accession number :
- edsair.doi...........0a8d3e32abc5d5f4a468d3be571eea10