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How to ensure zero defects from the beginning with semiconductor test methods

Authors :
B. Gessner
Source :
ITC
Publication Year :
2007
Publisher :
IEEE, 2007.

Abstract

Today, reliability of electronic products is considered as the minimum requirement to ensure the functionality in a safe and reliable way over years. From the semiconductor sector, as the provider from high-integrated circuits, this trend, is one of the main challenges to ensure the reliability of the product, but much more to precisely predict the reliability of those products. austriamicrosystems very early recognized this trend and implemented the zero-defect program over all process steps from design to the end-of-the-life their product. In this paper an overview of the zero-defect program the achievements and the methods are described is shown.

Details

Database :
OpenAIRE
Journal :
2007 IEEE International Test Conference
Accession number :
edsair.doi...........0b796eadd14d9c13e1b15c76706d424f
Full Text :
https://doi.org/10.1109/test.2007.4437697