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Measurements of charge transfer efficiency in a proton-irradiated swept charge device

Authors :
Yong Chen
Zi-Liang Zhang
Yue Zhu
Jia Huo
Wei Li
Wei Hu
Guo-He Yin
Wei-Wei Cui
Xiao-Yan Liu
Yu-Sa Wang
Cheng-Kui Li
Tian-Xiang Chen
Bo Lu
Mao-Shun Li
Da-Wei Han
Juan Wang
Yanji Yang
Yi Zhang
Yupeng Xu
Source :
Chinese Physics C. 38:066001
Publication Year :
2014
Publisher :
IOP Publishing, 2014.

Abstract

Charged Coupled Devices (CCDs) have been successfully used in several low energy X-ray astronomical satellites over the past two decades. Their high energy resolution and high spatial resolution make them a perfect tool for low energy astronomy, such as observing the formation of galaxy clusters and the environment around black holes. The Low Energy X-ray Telescope (LE) group is developing a Swept Charge Device (SCD) for the Hard Xray Modulation Telescope (HXMT) satellite. A SCD is a special low energy X-ray CCD, which can be read out a thousand times faster than traditional CCDs, simultaneously keeping excellent energy resolution. A test method for measuring the charge transfer efficiency (CTE) of a prototype SCD has been set up. Studies of the charge transfer inefficiency (CTI) with a proton-irradiated SCD have been performed at a range of operating temperatures. The SCD is irradiated by 3x10(8)cm(-2) 10 MeV protons.

Details

ISSN :
16741137
Volume :
38
Database :
OpenAIRE
Journal :
Chinese Physics C
Accession number :
edsair.doi...........0f1e49bc54b528785880d9d86bebd9ba
Full Text :
https://doi.org/10.1088/1674-1137/38/6/066001