Back to Search
Start Over
New possibilities for phase-variation structural diagnostics of multiparametrical monocrystalline systems with defects
- Source :
- Semiconductor Physics, Quantum Electronics and Optoelectronics. 24:5-15
- Publication Year :
- 2021
- Publisher :
- National Academy of Sciences of Ukraine (Co. LTD Ukrinformnauka), 2021.
-
Abstract
- Fundamental new features and physical nature of possibilities for purposeful influence of interrelated variations in different experimental conditions on changes of the selectivity of sensitivity of azimuthal dependence of the total integrated intensity dynamical diffraction to various types of defects in single crystals have been determined. As a result, the efficiency of the previously developed phase-variation principles of diagnostics has been improved. The proposed approach enabled us to demonstrate the presence of additional types of defects in the single crystals under study and to determine the defects parameters (sizes and concentrations). It makes it possible to obtain additional sensitivity and informativeness for phase-variation structure multiparametrical non-destructive diagnostics of monocrystalline systems with defects of various types.
- Subjects :
- Monocrystalline silicon
Materials science
0103 physical sciences
02 engineering and technology
Electrical and Electronic Engineering
021001 nanoscience & nanotechnology
010306 general physics
0210 nano-technology
01 natural sciences
Engineering physics
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials
Subjects
Details
- ISSN :
- 16056582 and 15608034
- Volume :
- 24
- Database :
- OpenAIRE
- Journal :
- Semiconductor Physics, Quantum Electronics and Optoelectronics
- Accession number :
- edsair.doi...........0f68a0ee48e0ca743603f58b4b21e474
- Full Text :
- https://doi.org/10.15407/spqeo24.01.005