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Investigation of sequential thermal annealing effect on Cu-C70 nanocomposite thin film
- Source :
- Thin Solid Films. 680:75-80
- Publication Year :
- 2019
- Publisher :
- Elsevier BV, 2019.
-
Abstract
- Cu-C70 nanocomposite thin film is synthesized via thermal co-evaporation method. The atomic concentration of Cu in the thin film is found to be ~4.5 at.% using Rutherford backscattering spectroscopy. Sequential thermal annealing is performed in an inert atmosphere (in presence of Ar) at various temperatures. Surface plasmon resonance (SPR) is spotted at ~585 nm for the sample annealed at 300 °C and the SPR peak is shifted towards ~621 nm for the sample annealed at 400 °C. In order to determine the modifications arising in the structure of fullerene C70 matrix due to annealing, Raman spectroscopy is used. At the highest temperature of 400 °C, the high-intensity Raman active modes of fullerene C70 can still be observed which shows that fullerene C70 is not completely transformed into amorphous carbon upto this temperature. Transmission electron microscopy is performed to determine the size of particles which is obtained ~35 nm for the sample annealed at 400 °C. The red shift in SPR wavelength at 400 °C is ascribed to the growth of Cu nanoparticles.
- Subjects :
- 010302 applied physics
Materials science
Annealing (metallurgy)
Metals and Alloys
Analytical chemistry
02 engineering and technology
Surfaces and Interfaces
021001 nanoscience & nanotechnology
01 natural sciences
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
symbols.namesake
Amorphous carbon
Transmission electron microscopy
0103 physical sciences
Materials Chemistry
symbols
Thin film
Surface plasmon resonance
0210 nano-technology
Inert gas
Spectroscopy
Raman spectroscopy
Subjects
Details
- ISSN :
- 00406090
- Volume :
- 680
- Database :
- OpenAIRE
- Journal :
- Thin Solid Films
- Accession number :
- edsair.doi...........11629ee590106602fb3d1c2d710de70a