Back to Search Start Over

Wafer-Level Aging of InGaAs/GaAs Nano-Ridge p-i-n Diodes Monolithically Integrated on Silicon

Authors :
Ping-Yi Hsieh
Artemisia Tsiara
Barry O'Sullivan
Didit Yudistira
Marina Baryshnikova
Guido Groeseneken
Bernardette Kunert
Marianna Pantouvaki
Joris Van Campenhout
Ingrid De Wolf
Source :
2022 IEEE International Reliability Physics Symposium (IRPS).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 IEEE International Reliability Physics Symposium (IRPS)
Accession number :
edsair.doi...........1197339e394993111092d780a4b5c464

Tools

Authors Abstract Subjects Details