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Single dot optical spectroscopy of silicon nanocrystals: low temperature measurements
- Source :
- Optical Materials. 27:973-976
- Publication Year :
- 2005
- Publisher :
- Elsevier BV, 2005.
-
Abstract
- Single dot spectroscopy allows studying properties of a single nanocrystal avoiding inhomogeneous broadening of the emission band. Here, data obtained by this technique for Si nanocrystals fabricat ...
- Subjects :
- Photoluminescence
Materials science
Silicon
Physics::Optics
chemistry.chemical_element
Temperature measurement
Inorganic Chemistry
Condensed Matter::Materials Science
Physics::Atomic and Molecular Clusters
Electrical and Electronic Engineering
Physical and Theoretical Chemistry
Spectroscopy
Plasma etching
Condensed Matter::Other
business.industry
Organic Chemistry
Condensed Matter::Mesoscopic Systems and Quantum Hall Effect
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials
chemistry
Nanocrystal
Quantum dot
Optoelectronics
business
Electron-beam lithography
Subjects
Details
- ISSN :
- 09253467
- Volume :
- 27
- Database :
- OpenAIRE
- Journal :
- Optical Materials
- Accession number :
- edsair.doi...........11bec47ceb72d4277138ef1e942bc314
- Full Text :
- https://doi.org/10.1016/j.optmat.2004.08.046