Electronic depth profiles with atomic layer resolution from resonant X-ray reflectivity

Authors :: Jochen Geck
J. E. Hamann-Borrero
Lambert Alff
Uwe Treske
Enrico Schierle
Philipp Komissinskiy
Mehran Vafaee
S. Sutarto
George A. Sawatzky
M. Zwiebler
Jak Chakhalian
J. W. Freeland
S. Macke
Feizhou He
Eugen Weschke
Andreas Koitzsch
B. Gray
Source :: Acta Crystallographica Section A Foundations and Advances. 71:s169-s169
Publication Year :: 2015
Publisher :: International Union of Crystallography (IUCr), 2015.

Subjects :: Inorganic Chemistry
X-ray reflectivity
Optics
Materials science
Structural Biology
business.industry
Resolution (electron density)
General Materials Science
Physical and Theoretical Chemistry
Condensed Matter Physics
business
Biochemistry
Layer (electronics)

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