Back to Search
Start Over
Identifying the Nature of Semiconductor’s Dislocation Density by Positron-Annihilation Spectroscopy Method. Overview
- Source :
- Nanotechnology Research and Practice. 4:213-229
- Publication Year :
- 2014
- Publisher :
- Academic Publishing House Researcher, 2014.
Details
- ISSN :
- 23127856
- Volume :
- 4
- Database :
- OpenAIRE
- Journal :
- Nanotechnology Research and Practice
- Accession number :
- edsair.doi...........1324c3e18ca3e21c4a07385ac9f31eaa
- Full Text :
- https://doi.org/10.13187/ejnr.2014.4.213