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Failure Analysis and Improvement for High Power Single-Phase Module
- Source :
- IEEE Transactions on Device and Materials Reliability. 17:170-175
- Publication Year :
- 2017
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2017.
-
Abstract
- The failure mechanism of the single-phase power module for three-phase converter applications with high output power is investigated. It illustrates that the higher current density on the near-terminal side of the power device, along with the abreast bonding that induces thermal coupling at the second footprints of bond wires, together result in the failure of the power device in the module. Then, an improved bonding method by redistributing the bond wires is proposed to solve the reliability problem. The bond wires are staggerly soldered on the surface of the device, avoiding the second footprints from listing in a line to reduce the thermal accumulation. The simulation performed by TCAD ANSYS shows that the junction temperature ( ${\mathbf{T}}_{\mathbf{j}} $ ) can be effectively decreased through this way. A practical experiment is also carried out to verify the availability of the optimized bonding method, which demonstrates that the improved method can decrease the ${\mathbf{T}}_{\mathbf{j}} $ of the device by 17 °C under 65A operating current.
- Subjects :
- 010302 applied physics
Materials science
Condensed matter physics
business.industry
020208 electrical & electronic engineering
Electrical engineering
02 engineering and technology
01 natural sciences
Finite element method
Electronic, Optical and Magnetic Materials
Power (physics)
Reliability (semiconductor)
Electricity generation
Power module
0103 physical sciences
Thermal
Hardware_INTEGRATEDCIRCUITS
0202 electrical engineering, electronic engineering, information engineering
Junction temperature
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
business
Current density
Subjects
Details
- ISSN :
- 15582574 and 15304388
- Volume :
- 17
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Device and Materials Reliability
- Accession number :
- edsair.doi...........13dd78b6c01ffd8b6557e8b27791a099