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Failure Analysis and Improvement for High Power Single-Phase Module

Authors :
Yu Chuanwu
Zhu Yuanzheng
Zhu Jiutao
Siyang Liu
Haiyang Song
Jiaxing Wei
Wang Ning
Kaixin Si
Chunwei Zhang
Peng Ye
Weifeng Sun
Source :
IEEE Transactions on Device and Materials Reliability. 17:170-175
Publication Year :
2017
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2017.

Abstract

The failure mechanism of the single-phase power module for three-phase converter applications with high output power is investigated. It illustrates that the higher current density on the near-terminal side of the power device, along with the abreast bonding that induces thermal coupling at the second footprints of bond wires, together result in the failure of the power device in the module. Then, an improved bonding method by redistributing the bond wires is proposed to solve the reliability problem. The bond wires are staggerly soldered on the surface of the device, avoiding the second footprints from listing in a line to reduce the thermal accumulation. The simulation performed by TCAD ANSYS shows that the junction temperature ( ${\mathbf{T}}_{\mathbf{j}} $ ) can be effectively decreased through this way. A practical experiment is also carried out to verify the availability of the optimized bonding method, which demonstrates that the improved method can decrease the ${\mathbf{T}}_{\mathbf{j}} $ of the device by 17 °C under 65A operating current.

Details

ISSN :
15582574 and 15304388
Volume :
17
Database :
OpenAIRE
Journal :
IEEE Transactions on Device and Materials Reliability
Accession number :
edsair.doi...........13dd78b6c01ffd8b6557e8b27791a099