Atomic-scale Structural Imaging of Interfacial Defects in GaAs(001)-based Heterostructures

Authors :: Thomas J. Rotter
Ganesh Balakrishnan
Abhinandan Gangopadhyay
David J. Smith
Source :: Microscopy and Microanalysis. 27:2356-2357
Publication Year :: 2021
Publisher :: Oxford University Press (OUP), 2021.

Subjects :: Materials science
business.industry
Optoelectronics
Heterojunction
business
Instrumentation
Atomic units
Structural imaging

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