Interface roughness of short‐period AlAs/GaAs superlattices studied by spectroscopic ellipsometry

MLA

S. B. Qadri, et al. “Interface Roughness of Short‐period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry.” Journal of Applied Physics, vol. 73, June 1993, pp. 7739–46. EBSCOhost, https://doi.org/10.1063/1.353972.

APA

S. B. Qadri, Nhan V. Nguyen, Paul M. Amirtharaj, David G. Seiler, & Joseph G. Pellegrino. (1993). Interface roughness of short‐period AlAs/GaAs superlattices studied by spectroscopic ellipsometry. Journal of Applied Physics, 73, 7739–7746. https://doi.org/10.1063/1.353972

Chicago

S. B. Qadri, Nhan V. Nguyen, Paul M. Amirtharaj, David G. Seiler, and Joseph G. Pellegrino. 1993. “Interface Roughness of Short‐period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry.” Journal of Applied Physics 73 (June): 7739–46. doi:10.1063/1.353972.