Application of factor analysis in electron spectrometry (AES, XPS) for materials science

MLA

Stefan Baunack, and Steffen Oswald. “Application of Factor Analysis in Electron Spectrometry (AES, XPS) for Materials Science.” Zeitschrift Für Metallkunde, vol. 96, Sept. 2005, pp. 972–82. EBSCOhost, https://doi.org/10.3139/146.101128.

APA

Stefan Baunack, & Steffen Oswald. (2005). Application of factor analysis in electron spectrometry (AES, XPS) for materials science. Zeitschrift Für Metallkunde, 96, 972–982. https://doi.org/10.3139/146.101128

Chicago

Stefan Baunack, and Steffen Oswald. 2005. “Application of Factor Analysis in Electron Spectrometry (AES, XPS) for Materials Science.” Zeitschrift Für Metallkunde 96 (September): 972–82. doi:10.3139/146.101128.