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New threshold voltage definition for undoped symmetrical DG MOSFET

Authors :
Lidia Łukasiak
Pawel Salek
Andrzej Jakubowski
Source :
Microelectronics Reliability. 52:294-295
Publication Year :
2012
Publisher :
Elsevier BV, 2012.

Abstract

A new threshold definition is proposed for symmetrical undoped double gate MOS (DGMOS). Threshold voltage is calculated using the potential model described in [1] with only two fitting parameters, the values of which do not depend on device geometry. Comparison with the results of numerical simulations and other models of VT is presented and good accuracy of the new model is demonstrated.

Details

ISSN :
00262714
Volume :
52
Database :
OpenAIRE
Journal :
Microelectronics Reliability
Accession number :
edsair.doi...........1675a79df7c510300540fe89fa2b9f2e
Full Text :
https://doi.org/10.1016/j.microrel.2011.07.083