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Carrier Capture Dynamics of Deep-Level Defects in Neutron-Irradiated Si With Improved Intracascade Potential

Authors :
Jun Liu
Pengdi Li
Qirong Zheng
Chuanguo Zhang
Yonggang Li
Yongsheng Zhang
Gaofeng Zhao
Xiaolan Yan
Bing Huang
Zhi Zeng
Source :
IEEE Transactions on Nuclear Science. 70:113-122
Publication Year :
2023
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2023.

Subjects

Subjects :
Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

Details

ISSN :
15581578 and 00189499
Volume :
70
Database :
OpenAIRE
Journal :
IEEE Transactions on Nuclear Science
Accession number :
edsair.doi...........16d59dd30d0caee45d5ffe0adc20ceaf

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