Critical Current Degradation in High-Temperature Superconducting Tapes Caused by Temperature Rise

MLA

T. Kotoyori, et al. “Critical Current Degradation in High-Temperature Superconducting Tapes Caused by Temperature Rise.” IEEE Transactions on Applied Superconductivity, vol. 23, June 2013, p. 4602304. EBSCOhost, https://doi.org/10.1109/tasc.2013.2244157.

APA

T. Kotoyori, Nobuyuki Miyahara, Atsushi Ishiyama, A. Karasawa, & S. Yazaki. (2013). Critical Current Degradation in High-Temperature Superconducting Tapes Caused by Temperature Rise. IEEE Transactions on Applied Superconductivity, 23, 4602304. https://doi.org/10.1109/tasc.2013.2244157

Chicago

T. Kotoyori, Nobuyuki Miyahara, Atsushi Ishiyama, A. Karasawa, and S. Yazaki. 2013. “Critical Current Degradation in High-Temperature Superconducting Tapes Caused by Temperature Rise.” IEEE Transactions on Applied Superconductivity 23 (June): 4602304. doi:10.1109/tasc.2013.2244157.