Cite
Characterization of SiN/SiO2 based MEMS-VCSEL at 1550 nm for optical coherence tomography
MLA
Irene Rodriguez Lamoso, et al. “Characterization of SiN/SiO2 Based MEMS-VCSEL at 1550 Nm for Optical Coherence Tomography.” Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XXVII, Mar. 2023. EBSCOhost, https://doi.org/10.1117/12.2652961.
APA
Irene Rodriguez Lamoso, Alejandro Martínez Jiménez, Julijan Cesar, Sascha Preu, & Adrian G. H. Podoleanu. (2023). Characterization of SiN/SiO2 based MEMS-VCSEL at 1550 nm for optical coherence tomography. Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XXVII. https://doi.org/10.1117/12.2652961
Chicago
Irene Rodriguez Lamoso, Alejandro Martínez Jiménez, Julijan Cesar, Sascha Preu, and Adrian G. H. Podoleanu. 2023. “Characterization of SiN/SiO2 Based MEMS-VCSEL at 1550 Nm for Optical Coherence Tomography.” Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XXVII, March. doi:10.1117/12.2652961.