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Single particle dark current spikes induced in CCDs by high energy neutrons
- Source :
- IEEE Transactions on Nuclear Science. 50:2011-2017
- Publication Year :
- 2003
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2003.
-
Abstract
- This paper presents an analysis of dark signal nonuniformity induced in a charge coupled device (CCD) by 90 MeV neutrons. Random telegraph signal switching between multiple levels was seen for some dark current spikes. The probability distribution of the dark current spikes is shown to be pseudo-exponential and the distribution remains exponential during annealing, but with an increasing decay constant. Similar dark current spikes were also observed to be generated in an APS device exposed to high energy neutrons at the WNR facility.
- Subjects :
- Physics
Nuclear and High Energy Physics
High energy
Quantitative Biology::Neurons and Cognition
Dark conductivity
Astrophysics::Cosmology and Extragalactic Astrophysics
Exponential function
Nuclear Energy and Engineering
Probability distribution
Charge-coupled device
Neutron
Electrical and Electronic Engineering
Atomic physics
Exponential decay
Dark current
Subjects
Details
- ISSN :
- 15581578 and 00189499
- Volume :
- 50
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Nuclear Science
- Accession number :
- edsair.doi...........190adf5b1ee3fde77f1a72b48109fc6d
- Full Text :
- https://doi.org/10.1109/tns.2003.821813