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Layer Insulation Losses and Life Above Ionization Threshold at High-Frequency and Pulsed Stresses

Authors :
Alex Pokryvailo
Hiren Dave
Source :
IEEE Transactions on Plasma Science. 50:3351-3360
Publication Year :
2022
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2022.

Details

ISSN :
19399375 and 00933813
Volume :
50
Database :
OpenAIRE
Journal :
IEEE Transactions on Plasma Science
Accession number :
edsair.doi...........1aa633ffb9c6dc5daf3f8e9ab2f8d2f0