New method for the preparation of S doped Fe samples characterized by AES and TOF-SIMS depth profiling

MLA

H.C. Swart, et al. “New Method for the Preparation of S Doped Fe Samples Characterized by AES and TOF-SIMS Depth Profiling.” Surface and Interface Analysis, vol. 46, Apr. 2014, pp. 1064–67. EBSCOhost, https://doi.org/10.1002/sia.5448.

APA

H.C. Swart, P.E. Barnard, & Jacobus J. Terblans. (2014). New method for the preparation of S doped Fe samples characterized by AES and TOF-SIMS depth profiling. Surface and Interface Analysis, 46, 1064–1067. https://doi.org/10.1002/sia.5448

Chicago

H.C. Swart, P.E. Barnard, and Jacobus J. Terblans. 2014. “New Method for the Preparation of S Doped Fe Samples Characterized by AES and TOF-SIMS Depth Profiling.” Surface and Interface Analysis 46 (April): 1064–67. doi:10.1002/sia.5448.