Single Element Time Resolved Emission Probing for Practical Microprocessor Diagnostic Applications

This paper presents the first single element time resolved emission (TRE) data collected from microprocessors fabricated with 0.13 µm process silicon using tester loop lengths, and in many cases acquisition times, comparable to laser voltage probing. The data presented here demonstrate that TRE tools with highly sensitive single element detectors can be used for practical microprocessor circuit diagnostics with reasonable acquisition times.