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Steady moving contact line of water over a no-slip substrate
- Source :
- The European Physical Journal Special Topics. 229:1897-1921
- Publication Year :
- 2020
- Publisher :
- Springer Science and Business Media LLC, 2020.
-
Abstract
- The movement of the triple contact line plays a crucial role in many applications such as ink-jet printing, liquid coating and drainage (imbibition) in porous media. To design accurate computational tools for these applications, predictive models of the moving contact line are needed. However, the basic mechanisms responsible for movement of the triple contact line are not well understood but still debated. We investigate the movement of the contact line between water, vapour and a silica-like solid surface under steady conditions in low capillary number regime. We use molecular dynamics (MD) with an atomistic water model to simulate a nanoscopic drop between two moving plates. We include hydrogen bonding between the water molecules and the solid substrate, which leads to a sub-molecular slip length. We benchmark two continuum methods, the Cahn–Hilliard phase-field (PF) model and a volume-of-fluid (VOF) model, against MD results. We show that both continuum models reproduce the statistical measures obtained from MD reasonably well, with a trade-off in accuracy. We demonstrate the importance of the phase-field mobility parameter and the local slip length in accurately modelling the moving contact line.
- Subjects :
- Materials science
Drop (liquid)
General Physics and Astronomy
Mechanics
Slip (materials science)
01 natural sciences
Capillary number
010305 fluids & plasmas
Molecular dynamics
0103 physical sciences
Volume of fluid method
Water model
General Materials Science
Physical and Theoretical Chemistry
010306 general physics
Porous medium
Nanoscopic scale
Subjects
Details
- ISSN :
- 19516401 and 19516355
- Volume :
- 229
- Database :
- OpenAIRE
- Journal :
- The European Physical Journal Special Topics
- Accession number :
- edsair.doi...........1cca2e08caf01f381bc0a159c0fb830b
- Full Text :
- https://doi.org/10.1140/epjst/e2020-900280-9