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Single-event upset in the PowerPC750 microprocessor
- Source :
- IEEE Transactions on Nuclear Science. 48:1822-1827
- Publication Year :
- 2001
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2001.
-
Abstract
- Proton and heavy ion upset susceptibility has been measured individually for six types of storage elements in an advanced commercial processor, the PowerPC750, from two manufacturers: Motorola and IBM. Data on interfering program malfunctions was also collected. Compared to earlier PPC603e results, the upset susceptibility has decreased somewhat.
- Subjects :
- Nuclear and High Energy Physics
Engineering
ComputerSystemsOrganization_COMPUTERSYSTEMIMPLEMENTATION
business.industry
Nuclear engineering
Hardware_PERFORMANCEANDRELIABILITY
Upset
law.invention
Microprocessor
Nuclear Energy and Engineering
law
Single event upset
Computer data storage
Electronic engineering
Heavy ion
Electrical and Electronic Engineering
IBM
business
Subjects
Details
- ISSN :
- 15581578 and 00189499
- Volume :
- 48
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Nuclear Science
- Accession number :
- edsair.doi...........1d3535d1d7ed52fb622f979c780217f0
- Full Text :
- https://doi.org/10.1109/23.983136