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A Novel Dynamic Process Control Scheme to Improve Cycle Time in Fabs
- Source :
- IEEE Transactions on Semiconductor Manufacturing. 30:32-38
- Publication Year :
- 2017
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2017.
-
Abstract
- Based on previous results showing the tradeoff existing between cycle time (CT) and yield in fabs we propose to dynamically set the control limits of the statistical process control. The limits are determined based on the current level of congestion. We study both a single station and a simple multiple station transfer line and show that the resulting operating points are vastly better in terms of CT, while keeping the yield loss at acceptable levels.
- Subjects :
- Scheme (programming language)
0209 industrial biotechnology
Engineering
021103 operations research
business.industry
0211 other engineering and technologies
Transfer line
02 engineering and technology
Condensed Matter Physics
Statistical process control
Industrial engineering
Industrial and Manufacturing Engineering
Process control monitoring
Electronic, Optical and Magnetic Materials
Reliability engineering
Set (abstract data type)
Cycle time
020901 industrial engineering & automation
Control limits
Process control
Electrical and Electronic Engineering
business
computer
computer.programming_language
Subjects
Details
- ISSN :
- 15582345 and 08946507
- Volume :
- 30
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Semiconductor Manufacturing
- Accession number :
- edsair.doi...........1dcfbb4a1dfa50c40457e6001edb3423
- Full Text :
- https://doi.org/10.1109/tsm.2016.2617895