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A Novel Dynamic Process Control Scheme to Improve Cycle Time in Fabs

Authors :
Michael Hassoun
Source :
IEEE Transactions on Semiconductor Manufacturing. 30:32-38
Publication Year :
2017
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2017.

Abstract

Based on previous results showing the tradeoff existing between cycle time (CT) and yield in fabs we propose to dynamically set the control limits of the statistical process control. The limits are determined based on the current level of congestion. We study both a single station and a simple multiple station transfer line and show that the resulting operating points are vastly better in terms of CT, while keeping the yield loss at acceptable levels.

Details

ISSN :
15582345 and 08946507
Volume :
30
Database :
OpenAIRE
Journal :
IEEE Transactions on Semiconductor Manufacturing
Accession number :
edsair.doi...........1dcfbb4a1dfa50c40457e6001edb3423
Full Text :
https://doi.org/10.1109/tsm.2016.2617895