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A Thin Layer Method for the LA-ICP-MS Analysis of Trace Element Concentrates

Authors :
N. S. Medvedev
V. D. Kurbatova
A. I. Saprykin
Source :
Journal of Analytical Chemistry. 78:316-323
Publication Year :
2023
Publisher :
Pleiades Publishing Ltd, 2023.

Subjects

Subjects :
Analytical Chemistry

Details

ISSN :
16083199 and 10619348
Volume :
78
Database :
OpenAIRE
Journal :
Journal of Analytical Chemistry
Accession number :
edsair.doi...........1f529b5dee6e223eb8d8e88f8c32d199
Full Text :
https://doi.org/10.1134/s1061934823030097