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Magnetic Force Microscopy Study of Alternate Sputtered (001), Oriented L1 0 Phase FePt Films
- Source :
- Chinese Physics Letters. 24:222-225
- Publication Year :
- 2007
- Publisher :
- IOP Publishing, 2007.
-
Abstract
- We present a magnetic force microscopy study of alternate sputtered (001) oriented L1(0) phase FePt films. It is found that the root-mean-square value of phase shift of magnetic force images, can be used to characterize the perpendicular anisotropy for a series of specimens. Therefore, the considerable improvement of the perpendicular anisotropy after post-annealing can be characterized. In addition, the magnetic properties, magnetic and crystalline microstructures before and after post-annealing are compared for the typical [Fe5nmPt5nm](10) film with substrate temperature T-s = 500 degrees C, single layer thickness d = 5 nm and total layer thickness D = 100 nm to confirm the effect of post-annealing on improving the perpendicular anisotropy for Fe-Pt films.
Details
- ISSN :
- 17413540 and 0256307X
- Volume :
- 24
- Database :
- OpenAIRE
- Journal :
- Chinese Physics Letters
- Accession number :
- edsair.doi...........204de8154330305147436bd91d8e209b