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Novel Robust Photoplethysmogram-Based Authentication

Authors :
Limeng Pu
Pedro J. Chacon
Hsiao-Chun Wu
Jin-Woo Choi
Source :
IEEE Sensors Journal. 22:4675-4686
Publication Year :
2022
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2022.

Details

ISSN :
23799153 and 1530437X
Volume :
22
Database :
OpenAIRE
Journal :
IEEE Sensors Journal
Accession number :
edsair.doi...........21c7768492908bb023bea80ef071d770