Back to Search Start Over

Transient Current Enhancement in MIS Tunnel Diodes With Lateral Electric Field Induced by Designed High-Low Oxide Layers

Authors :
Sung-Wei Huang
Jenn-Gwo Hwu
Source :
IEEE Transactions on Electron Devices. 68:6580-6585
Publication Year :
2021
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2021.

Details

ISSN :
15579646 and 00189383
Volume :
68
Database :
OpenAIRE
Journal :
IEEE Transactions on Electron Devices
Accession number :
edsair.doi...........22568d35f546dbfc138baf653e099e49
Full Text :
https://doi.org/10.1109/ted.2021.3122814