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A Discussion of Artificial Intelligence Applications in SiC MOSFET Device Operation

Authors :
Jayanth Regatti
Jin Wang
Abhishek Gupta
Alec Schnabel
Han Wang
Boxue Hu
Julia Zhang
Jon Hall
Haoyang You
Source :
2021 IEEE International Electric Machines & Drives Conference (IEMDC).
Publication Year :
2021
Publisher :
IEEE, 2021.

Abstract

Despite the several advantages, SiC MOSFETs suffer from issues such as low current carrying capacity, device degradation, etc. In this study, we explore the applications of Artificial Intelligence algorithms in optimizing the operation of SiC MOSFETs. We introduce the different notions of learning algorithms and provide a summary on their applications. In particular, we discuss earlier applications of AI algorithms in studying the properties of SiC MOSFETs, and highlight some challenges associated with parallel operation of SiC MOSFETs.

Details

Database :
OpenAIRE
Journal :
2021 IEEE International Electric Machines & Drives Conference (IEMDC)
Accession number :
edsair.doi...........22a543e948cb14483f9ed8828630d61c
Full Text :
https://doi.org/10.1109/iemdc47953.2021.9449497