A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation

MLA

Javier Martin-Martinez, et al. “A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation.” 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), July 2018. EBSCOhost, https://doi.org/10.1109/smacd.2018.8434867.

APA

Javier Martin-Martinez, Rafael Castro-Lopez, Javier Diaz-Fortuny, A. Toro-Frias, P. Saraza-Canflanca, Rosana Rodriguez, Francisco V. Fernández, Elisenda Roca, & Montserrat Nafria. (2018). A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation. 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD). https://doi.org/10.1109/smacd.2018.8434867

Chicago

Javier Martin-Martinez, Rafael Castro-Lopez, Javier Diaz-Fortuny, A. Toro-Frias, P. Saraza-Canflanca, Rosana Rodriguez, Francisco V. Fernández, Elisenda Roca, and Montserrat Nafria. 2018. “A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation.” 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), July. doi:10.1109/smacd.2018.8434867.