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Drain Current Variability in 2-levels Stacked Nanowire Gate All Around P-type Field Effect Transistors

Authors :
Donghyun Kim
Sylvain Barraud
Gerard Ghibaudo
Christoforos Theodorou
Jae Woo Lee
Source :
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Publication Year :
2023
Publisher :
IEEE, 2023.

Details

Database :
OpenAIRE
Journal :
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
Accession number :
edsair.doi...........254fe6bb6107580bb11dace87e4ad4d5

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