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Characterization of epoxy based highly filled die attach materials in microelectronics

Authors :
M. Hartung
Laurens Weiss
Duc-Khoi Vu
Bruno Michel
I. Maus
Bernhard Wunderle
H. Preu
C. Liebl
Kaspar M. B. Jansen
Markus Fink
Source :
2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
Publication Year :
2017
Publisher :
IEEE, 2017.

Abstract

In semiconductor technologies thermally and electrically conductive adhesives are widely used to attach the die to the substrate. Focus of this work are Isotropic Conductive Adhesives (ICA) with a high amount of electrically conductive filler particles and the characterization of such materials.

Details

Database :
OpenAIRE
Journal :
2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
Accession number :
edsair.doi...........259f93535c0b64707eefeb91bae0059d
Full Text :
https://doi.org/10.1109/eurosime.2017.7926237