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Scanning Surface Potential Microscopy for Local Surface Analysis
- Source :
- Chemistry Letters. 21:2223-2226
- Publication Year :
- 1992
- Publisher :
- The Chemical Society of Japan, 1992.
-
Abstract
- A Scanning Surface Potential Microscopic (SSPM) instrument was built by modifying a commercial atomic force microscope (AFM), Seiko SFA 300 with a SPI 3600 probe station. Distribution of surface potentials on test samples microlithographically prepared and on mixed Langmuir-Blodgett (LB) films coated on a vapor-deposited gold film could be imaged in a x-y spatial resolution less than 1 μm and compared with AFM images observed on the same samples.
Details
- ISSN :
- 13480715 and 03667022
- Volume :
- 21
- Database :
- OpenAIRE
- Journal :
- Chemistry Letters
- Accession number :
- edsair.doi...........266c408ff3b19fe1c1079ee651b2ac01
- Full Text :
- https://doi.org/10.1246/cl.1992.2223