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Scanning Surface Potential Microscopy for Local Surface Analysis

Authors :
Masamichi Fujihira
Masatoshi Yasutake
Hirosuke Kawate
Source :
Chemistry Letters. 21:2223-2226
Publication Year :
1992
Publisher :
The Chemical Society of Japan, 1992.

Abstract

A Scanning Surface Potential Microscopic (SSPM) instrument was built by modifying a commercial atomic force microscope (AFM), Seiko SFA 300 with a SPI 3600 probe station. Distribution of surface potentials on test samples microlithographically prepared and on mixed Langmuir-Blodgett (LB) films coated on a vapor-deposited gold film could be imaged in a x-y spatial resolution less than 1 μm and compared with AFM images observed on the same samples.

Details

ISSN :
13480715 and 03667022
Volume :
21
Database :
OpenAIRE
Journal :
Chemistry Letters
Accession number :
edsair.doi...........266c408ff3b19fe1c1079ee651b2ac01
Full Text :
https://doi.org/10.1246/cl.1992.2223