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Background Model Based on Statistical Local Difference Pattern

Authors :
Satoshi Yoshinaga
Hajime Nagahara
Rin-ichiro Taniguchi
Atsushi Shimada
Source :
Computer Vision-ACCV 2012 Workshops ISBN: 9783642374098, ACCV Workshops (1)
Publication Year :
2013
Publisher :
Springer Berlin Heidelberg, 2013.

Abstract

We present a robust background model for object detection and report its evaluation results using the database of Background Models Challenge (BMC). Our background model is based on a statistical local feature. In particular, we use an illumination invariant local feature and describe its distribution by using a statistical framework. Thanks to the effectiveness of the local feature and the statistical framework, our method can adapt to both illumination and dynamic background changes. Experimental results, which are done thanks to the database of BMC, show that our method can detect foreground objects robustly against background changes.

Details

ISBN :
978-3-642-37409-8
ISBNs :
9783642374098
Database :
OpenAIRE
Journal :
Computer Vision-ACCV 2012 Workshops ISBN: 9783642374098, ACCV Workshops (1)
Accession number :
edsair.doi...........26c97592f091540999b29a9db8b83a22