Cite
Frequency dependence of the second derivative of the currant-voltage characteristic of the heterostructure SnO/sub 2/-Si at the gas adsorption
MLA
V. V. Il’chenko, et al. “Frequency Dependence of the Second Derivative of the Currant-Voltage Characteristic of the Heterostructure SnO/Sub 2/-Si at the Gas Adsorption.” Proceedings of IEEE Sensors 2003 (IEEE Cat. No.03CH37498), July 2004. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........2713ef8059da7410c8f717436c141214&authtype=sso&custid=ns315887.
APA
V. V. Il’chenko, V. T. Grinchenko, V. P. Chehun, V.V. Telega, A. M. Gaskov, & A. I. Kravchenko. (2004). Frequency dependence of the second derivative of the currant-voltage characteristic of the heterostructure SnO/sub 2/-Si at the gas adsorption. Proceedings of IEEE Sensors 2003 (IEEE Cat. No.03CH37498).
Chicago
V. V. Il’chenko, V. T. Grinchenko, V. P. Chehun, V.V. Telega, A. M. Gaskov, and A. I. Kravchenko. 2004. “Frequency Dependence of the Second Derivative of the Currant-Voltage Characteristic of the Heterostructure SnO/Sub 2/-Si at the Gas Adsorption.” Proceedings of IEEE Sensors 2003 (IEEE Cat. No.03CH37498), July. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........2713ef8059da7410c8f717436c141214&authtype=sso&custid=ns315887.