Validation of Field-Plate Structures in Transistors on Rad-hardened

Authors :: Jing Li
Jie Liu
Xue Wu
Guohua Shui
Zhikuan Wang
Source :: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED).
Publication Year :: 2018
Publisher :: IEEE, 2018.
Abstract: Poly and metal field-plate structures were designed in lateral-PNP bipolar junction transistors which fabricated on standard linear bipolar technology for validating their TID hardened effectiveness. 60Co γ irradiation experiment was executed on these samples and experimental results were compared. Results showed that metal field-plate was better than poly field-plate.

Subjects :: Materials science
Field (physics)
business.industry
law
Transistor
Optoelectronics
business
γ irradiation
law.invention

Database :: OpenAIRE
Journal :: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED)
Accession number :: edsair.doi...........27c67384cd3ff86e2fe1ca2ae717b9ab

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