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Determination of A-site deficiency in lanthanum manganite by XRD intensity ratio
- Source :
- Journal of Solid State Chemistry. 181:700-704
- Publication Year :
- 2008
- Publisher :
- Elsevier BV, 2008.
-
Abstract
- A method based on the X-ray diffraction intensity ratio was developed to determine the maximum deficiency that the perovskite-structured La1−xMnO3±δ can accommodate at the A-site. Computer simulation predicts that the intensity ratio of (024) and (012) reflections for La1−xMnO3±δ in hexagonal setting increases with increasing the La deficiency x. XRD analysis shows that with increasing x until 0.09, the ratio increases as predicted, then levels off with further increase in x. An abrupt change in electrical conductivity is also observed at x of ∼0.10. It is concluded that the maximum deficiency lies in between 0.09 and 0.10 for La1−xMnO3±δ. The methodology presented in this paper in principle can be applied to other perovskite-structured materials.
- Subjects :
- Diffraction
Materials science
Analytical chemistry
Mineralogy
Crystal growth
Condensed Matter Physics
Manganite
Crystallographic defect
Electronic, Optical and Magnetic Materials
Inorganic Chemistry
chemistry.chemical_compound
Lanthanum manganite
chemistry
Electrical resistivity and conductivity
X-ray crystallography
Materials Chemistry
Ceramics and Composites
Physical and Theoretical Chemistry
Perovskite (structure)
Subjects
Details
- ISSN :
- 00224596
- Volume :
- 181
- Database :
- OpenAIRE
- Journal :
- Journal of Solid State Chemistry
- Accession number :
- edsair.doi...........27e3c78c6aa8557a674563e1562e0c5b