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A Fully Integrated DAC for CMOS Position-Based Charge Qubits with Single-Electron Detector Loopback Testing

Authors :
Eugene Koskin
Imran Bashir
R. Bogdan Staszewski
Elena Blokhina
Dirk Leipold
Kai Xu
Anna Koziol
Hongying Wang
Ali Esmailiyan
Mike Asker
Source :
IEEE Solid-State Circuits Letters. 3:354-357
Publication Year :
2020
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2020.

Abstract

This letter presents a fully integrated interface circuitry with a position-based charge qubit structure implemented in 22-nm FDSOI CMOS. The quantum structure is controlled by a tiny capacitive DAC (CDAC) that occupies $3.5\times 45\,\,\mu \text{m}^{2}$ and consumes 0.27mW running at a 2-GHz system clock. The state of the quantum structure is measured by a single-electron detector that consumes 1mW (including its output driver) with an area of $40\times 25\,\,\mu \text{m}^{2}$ . The low power and miniaturized layout of these circuits pave the way for integration in a large quantum core with thousands of qubits, which is a necessity for practical quantum computers. The CDAC output noise of 12 $\mu \text{V}$ -rms is estimated through mathematical analysis while the ≤ 0.225mV-rms input referred noise of the detector is verified by measurements at 3.4 K. The functionality of the system and performance of the CDAC are verified in a loopback mode with the detector sensing the CDAC-induced electron tunneling from the floating diffusion node into the quantum structure.

Details

ISSN :
25739603
Volume :
3
Database :
OpenAIRE
Journal :
IEEE Solid-State Circuits Letters
Accession number :
edsair.doi...........2af21133b85ae8761d6b4936f0ef0f91
Full Text :
https://doi.org/10.1109/lssc.2020.3018707