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Simulation and Experimental Study on Barrier Thickness of Superlattice Electron Blocking Layer in Near-Ultraviolet Light-Emitting Diodes
- Source :
- IEEE Journal of Quantum Electronics. 52:1-6
- Publication Year :
- 2016
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2016.
-
Abstract
- The optical performance and relevant physical properties of near-ultraviolet (NUV) GaN-based light-emitting diodes (LEDs) are investigated. Specifically, the influence of traditional AlGaN bulk electron blocking layer (EBL) and AlGaN/GaN superlattice (SL) EBL with various thicknesses of AlGaN layers on NUV LEDs is explored. It is indicated from the band diagrams, electrostatic field profile, electron reflecting and hole transmitting spectra, and carrier concentrations profile that the use of a thin AlGaN layer of AlGaN/GaN SL EBL is beneficial to the electron confinement and hole injection in the active region, which results in the high internal quantum efficiency and low efficiency droop at high injection current. Moreover, the experimental results show that replacing the traditional AlGaN bulk EBL with the AlGaN/GaN SL EBL can markedly improve the optical performance. When compared with the NUV LED with traditional AlGaN bulk EBL, the output power of the NUV LED with the proposed AlGaN/GaN SL EBL increases from 13.5 to 48.7 mW at 100 mA.
- Subjects :
- 010302 applied physics
Materials science
business.industry
Superlattice
Wide-bandgap semiconductor
Gallium nitride
02 engineering and technology
Electron
021001 nanoscience & nanotechnology
Condensed Matter Physics
01 natural sciences
Atomic and Molecular Physics, and Optics
law.invention
chemistry.chemical_compound
chemistry
law
0103 physical sciences
Optoelectronics
Spontaneous emission
Quantum efficiency
Electrical and Electronic Engineering
0210 nano-technology
business
Light-emitting diode
Diode
Subjects
Details
- ISSN :
- 15581713 and 00189197
- Volume :
- 52
- Database :
- OpenAIRE
- Journal :
- IEEE Journal of Quantum Electronics
- Accession number :
- edsair.doi...........2dae192914bc86bed7bc3b48b759ed61
- Full Text :
- https://doi.org/10.1109/jqe.2016.2587100