Characterization on Percolation of Nanostructured Silver Films by the Topological Properties of Spectroscopic Ellipsometric Parameter Trajectories

Authors :: Haotian Zhang
Songyou Wang
Jing Li
Yao Chen
Changchun Yan
Caiqin Han
Yu-Xiang Zheng
Rong-Jun Zhang
Pian Liu
Yao Shan
Liang-Yao Chen
Source :: The Journal of Physical Chemistry C. 124:28306-28312
Publication Year :: 2020
Publisher :: American Chemical Society (ACS), 2020.
Abstract: Silver (Ag) films with different nanostructures were prepared by electron beam evaporation and characterized by spectroscopic ellipsometry in combination with X-ray diffraction and field emission s...

Subjects :: Diffraction
Materials science
Nanostructure
Astrophysics::High Energy Astrophysical Phenomena
Physics::Optics
Astrophysics::Cosmology and Extragalactic Astrophysics
Electron beam physical vapor deposition
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Characterization (materials science)
Condensed Matter::Materials Science
Field electron emission
General Energy
Chemical physics
Percolation
Spectroscopic ellipsometry
Physical and Theoretical Chemistry
Astrophysics::Galaxy Astrophysics

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