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IEEE P1581 drastically simplifies connectivity test for memory devices

Authors :
H. Ehrenberg
Source :
ITC
Publication Year :
2008
Publisher :
IEEE, 2008.

Abstract

This poster provides an overview of IEEE P1581, for those not familiar with this standardization effort, and gives a status update of the IEEE P1581 specification development. We will also provide examples for the implementation of IEEE P1581 capabilities in SRAM, DRAM, and FLASH devices.

Details

Database :
OpenAIRE
Journal :
2008 IEEE International Test Conference
Accession number :
edsair.doi...........302bc7d15b491cfebe047cb3893b61fb
Full Text :
https://doi.org/10.1109/test.2008.4700681