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IEEE P1581 drastically simplifies connectivity test for memory devices
- Source :
- ITC
- Publication Year :
- 2008
- Publisher :
- IEEE, 2008.
-
Abstract
- This poster provides an overview of IEEE P1581, for those not familiar with this standardization effort, and gives a status update of the IEEE P1581 specification development. We will also provide examples for the implementation of IEEE P1581 capabilities in SRAM, DRAM, and FLASH devices.
Details
- Database :
- OpenAIRE
- Journal :
- 2008 IEEE International Test Conference
- Accession number :
- edsair.doi...........302bc7d15b491cfebe047cb3893b61fb
- Full Text :
- https://doi.org/10.1109/test.2008.4700681