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Spiral inductors and transmission lines in silicon technology using copper-damascene interconnects and low-loss substrates

Authors :
Daniel C. Edelstein
K.A. Jenkiin
Young H. Kwark
Joachim N. Burghartz
Source :
IEEE Transactions on Microwave Theory and Techniques. 45:1961-1968
Publication Year :
1997
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 1997.

Abstract

Spiral inductors and different types of transmission lines are fabricated by using copper (Cu)-damascene interconnects and high-resistivity silicon (HRS) or sapphire substrates. The fabrication process is compatible with the concepts of silicon device fabrication. Spiral inductors with 1.4-nH inductance have quality factors (Q) of 30 at 5.2 GHz and 40 at 5.8 GHz for the HRS and the sapphire substrates, respectively. 80-nH inductors have Q's as high as 13. The transmission-line losses are near 4 dB/cm at 10 GHz for microstrips, inverted microstrips, and coplanar lines, which are sufficiently small for maximum line lengths within typical silicon-chip areas. This paper shows that inductors with high Q's for lumped-element designs in the 1-10-GHz range and transmission lines with low losses for distributed-element designs beyond 10 GHz can be made available with the proposed adjustments to commercial silicon technology.

Details

ISSN :
00189480
Volume :
45
Database :
OpenAIRE
Journal :
IEEE Transactions on Microwave Theory and Techniques
Accession number :
edsair.doi...........308239b7eaa217e564a9ca90e7155f20
Full Text :
https://doi.org/10.1109/22.641804