Synchrotron Radiation Photoelectron Spectroscopy Study of Sr2CrReO6 Films

Thin films of ordered double perovskite Sr2CrReO6 were sputter-deposited on SrTiO3 (001), (111), LaAlO3 (001) substrates. With high quality thin films of the double perovskite Sr2CrReO6, we have investigated the electronic state of the inside of the Sr2CrReO6 thin films by Synchrotron Radiation photoelectron spectroscopy (XPS). The Re 4f spectrum of Sr2CrReO6 has shown a multiple peak structure, which originates from the electronic state of Re in half-metallic Sr2CrReO6. Moreover, it has been found that the electronic densities of states clearly exist on the Fermi energy.