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Reliability of High-Power 1060-nm DBR Lasers

Authors :
Yabo Li
Chung-En Zah
R.W. Davis
D.A.S. Loeber
Hong Ky Nguyen
Nick Visovsky
Martin H. Hu
Sean Coleman
Kechang Song
Source :
2006 IEEE LEOS Annual Meeting Conference Proceedings.
Publication Year :
2006
Publisher :
IEEE, 2006.

Abstract

We report highly reliable 1060-nm DBR lasers with a single-wavelength output power larger than 350 mW and a failure rate as low as 3.2 kFITs at a heat-sink temperature of 25degC and a gain current of 500 mA. The reliability data of the high-power 1060-nm DBR lasers under longest aging tests at the highest level of current and temperature stress have been obtained for the first time, to the best of our knowledge

Details

Database :
OpenAIRE
Journal :
2006 IEEE LEOS Annual Meeting Conference Proceedings
Accession number :
edsair.doi...........3338eeca3795f8be2bd2d78b419e2b3f
Full Text :
https://doi.org/10.1109/leos.2006.278795