Bias dependence of dose rate effects in the irradiated substrate PNP transistors

Total Dose ionizing radiation response of substrate PNP transistors have been investigated as functions of biases and dose rates. The experiment result shown that emitter-base junction bias dominates dose rate effects in the SPNP transistors. By considering of radiation induced interface traps and oxide trapped positive charges, the degradation mechanisms have been discussed based on space charge model. In addition, the worst case biases in the SPNP transistor with different dose rates are also discussed in this paper.