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Characterization of AlMg Alloys from their Electronic Structure

Authors :
Raynald Gauvin
K. Le Guen
P. Jonnard
J.-M. André
Source :
Microscopy and Microanalysis. 13
Publication Year :
2007
Publisher :
Oxford University Press (OUP), 2007.

Subjects

Subjects :
Materials science
Nanotechnology
Electronic structure
Instrumentation
Characterization (materials science)

Details

ISSN :
14358115 and 14319276
Volume :
13
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........33c4181b80e38378e92012af68c3689d
Full Text :
https://doi.org/10.1017/s1431927607072327
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