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Characterization of 600V/650V Commercial SiC Schottky Diodes at Extremely High Temperatures

Authors :
Yang Mingchao
Jinwei Qi
Wang Xuhui
Source :
2019 IEEE 10th International Symposium on Power Electronics for Distributed Generation Systems (PEDG).
Publication Year :
2019
Publisher :
IEEE, 2019.

Abstract

This paper evaluates the thermal characterization of late generation SiC schottky diodes for application of power electronics charging and operation systems. 600V/650V SiC Diodes are tested from 3 well-known manufactures: Wolfspeed, Infineon and Rohm. A comprehensive study is performed for a wide temperature range from 20°C (room temperature) up to 500°C, aiming to find the absolute maximum parameters of SiC schottky diodes at extremely high temperature environments. Both static and dynamic characterization are evaluated, which exhibit the performance and reliability of SiC schottky diodes for high temperature application conditions.

Details

Database :
OpenAIRE
Journal :
2019 IEEE 10th International Symposium on Power Electronics for Distributed Generation Systems (PEDG)
Accession number :
edsair.doi...........34f44de0128ddedcfd6ced07b2c312d1