Back to Search
Start Over
Effect of microcapsules doping on DC flashover and trap level of self-healing epoxy resin composites
- Source :
- Journal of Materials Science: Materials in Electronics. 32:2765-2773
- Publication Year :
- 2021
- Publisher :
- Springer Science and Business Media LLC, 2021.
-
Abstract
- Minor physical defects can decrease the dielectric efficiency of epoxy resin and severely threaten the electrical device’s dependability. Self-healing may be considered an effective method to preserve the electrical and mechanical properties of the epoxy resin. Besides, self-healing significantly decreases the influence of small physical destruction on the power system. In this research, epoxy resin incorporated with various concentration of microcapsules was prepared. The polyurea formaldehyde (PUF) microcapsules were treated using a silane coupling agent (KH550) to enhance dispersion. Moreover, the self-healing performance of the epoxy resin incorporated with microcapsules was analyzed by FTIR, SEM, and DC Flashover in air and vacuum. In addition, trap energy and trap density were obtained from measurements of surface potential decay (ISPD). The SEM results indicate that in comparison with pure epoxy resin, the microcapsule/epoxy resin composite has an improved self-healing performance. The DC Flashover of epoxy resin in air and vacuum was found relatively higher after incorporation of microcapsules than pure epoxy resin. The distribution of trap energy and trap density measured by surface potential decay measurements confirms that 5 wt% have deeper traps and the highest trap energy levels.
- Subjects :
- Materials science
Doping
Formaldehyde
Epoxy
Dielectric
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials
chemistry.chemical_compound
chemistry
visual_art
visual_art.visual_art_medium
Arc flash
Electrical and Electronic Engineering
Fourier transform infrared spectroscopy
Composite material
Dispersion (chemistry)
Polyurea
Subjects
Details
- ISSN :
- 1573482X and 09574522
- Volume :
- 32
- Database :
- OpenAIRE
- Journal :
- Journal of Materials Science: Materials in Electronics
- Accession number :
- edsair.doi...........37814886d37e20c15e93f548fcf6396c
- Full Text :
- https://doi.org/10.1007/s10854-020-05017-8