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X-ray photoelectron holography of ultrathin film and single crystal Cu(111): improving the accuracy of bond-length determination
- Source :
- Surface Science. 245:L190-L194
- Publication Year :
- 1991
- Publisher :
- Elsevier BV, 1991.
-
Abstract
- Forward-scattering diffraction patterns from single-crystal Cu(111) substrates and an epitaxial film of FCC Cu/Ir(111) have been analyzed to produce real-space images of the atomic lattice by Fourier-transform holography. The accuracy of atomic positions is found to be better in the single-crystal holograms than in the ultrathin film of copper. The angular dependence of the atomic scattering factor produces a shift in the position of atoms in the holographic image, and causes the atom image to be asymmetric. Model calculations reproduce the atom shift and asymmetry. A modified Fourier-transform algorithm is shown to correct for both the atom-shift and the image asymmetry.
- Subjects :
- Diffraction
Chemistry
Scattering
Analytical chemistry
Holography
Physics::Optics
Crystal growth
Surfaces and Interfaces
Condensed Matter Physics
Molecular physics
Surfaces, Coatings and Films
law.invention
Bond length
Condensed Matter::Materials Science
Electron diffraction
law
Condensed Matter::Superconductivity
Physics::Atomic and Molecular Clusters
Materials Chemistry
Physics::Atomic Physics
Thin film
Single crystal
Subjects
Details
- ISSN :
- 00396028
- Volume :
- 245
- Database :
- OpenAIRE
- Journal :
- Surface Science
- Accession number :
- edsair.doi...........37ef61af12beb696607e2e5d746097c9
- Full Text :
- https://doi.org/10.1016/0039-6028(91)90025-n