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X-ray photoelectron holography of ultrathin film and single crystal Cu(111): improving the accuracy of bond-length determination

Authors :
Dilano K. Saldin
S. Hardcastle
B.L. Chen
J. Zhang
Z.-L. Han
G. R. Harp
Brian P. Tonner
Source :
Surface Science. 245:L190-L194
Publication Year :
1991
Publisher :
Elsevier BV, 1991.

Abstract

Forward-scattering diffraction patterns from single-crystal Cu(111) substrates and an epitaxial film of FCC Cu/Ir(111) have been analyzed to produce real-space images of the atomic lattice by Fourier-transform holography. The accuracy of atomic positions is found to be better in the single-crystal holograms than in the ultrathin film of copper. The angular dependence of the atomic scattering factor produces a shift in the position of atoms in the holographic image, and causes the atom image to be asymmetric. Model calculations reproduce the atom shift and asymmetry. A modified Fourier-transform algorithm is shown to correct for both the atom-shift and the image asymmetry.

Details

ISSN :
00396028
Volume :
245
Database :
OpenAIRE
Journal :
Surface Science
Accession number :
edsair.doi...........37ef61af12beb696607e2e5d746097c9
Full Text :
https://doi.org/10.1016/0039-6028(91)90025-n