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Competition between bulk and interface plasmonic modes in valence electron energy-loss spectroscopy of ultrathinSiO2gate stacks

Authors :
Aycan Yurtsever
Martin Couillard
David A. Muller
Source :
Physical Review B. 77
Publication Year :
2008
Publisher :
American Physical Society (APS), 2008.

Subjects

Subjects :
Materials science
Reflection high-energy electron diffraction
Electron diffraction
Electron energy loss spectroscopy
Energy filtered transmission electron microscopy
Atomic physics
Condensed Matter Physics
Valence electron
Spectroscopy
Electron spectroscopy
Molecular physics
Plasmon
Electronic, Optical and Magnetic Materials

Details

ISSN :
1550235X and 10980121
Volume :
77
Database :
OpenAIRE
Journal :
Physical Review B
Accession number :
edsair.doi...........381ca45d93a7cbc980aa60c660f69621

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